Biography | |
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Dr. Michael Waltl Institute for Microelectronics, Austria |
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Title: Challenges for Robust Electronics Circuits and Devices | |
Abstract:
Electronic integrated circuits (ICs) have drastically influenced our
society over the past decades and have become an indispensable part of our
daily lives. With the continued integration of sensors with digital and analog
ICs, this trend is only increasing. Integrated sensors can be found in every
aspect of our every-day life, from health and safety monitoring to transport
and automation. A central aspect for long-term failure-safe and stable
operation of complex electrical circuits and applications, e.g., digital logic,
wireless communication, and sensing, is the robustness, high performance, and
reliable operation of the microelectronic components employed in these circuits.
The requirements for the electronics are thereby strongly
application-dependent. For instance, to fully exploit the sensitivity of available
sensors, low intrinsic noise of the electronics used to control the device is
critical. For SiC power transistors, as used for gas sensing in harsh
environments, photovoltaic cells, and automotive applications, high carrier
mobility is key to reducing losses in power conversion applications. However,
electronic devices suffer from time-zero and time-dependent variability in
their performance, which must be investigated in detail for these effects to be
considered at an early stage of the circuit design process. | |
Biography: Dr. Waltl is an Assistant Professor at the TU Wien, Vienna, Austria, and an IEEE Senior Member. His overall scientific focus is on the robustness of microelectronic devices and circuits. In this field, he investigates reliability issues – characterization and modeling – in semiconductor devices and circuits. Furthermore, Dr. Waltl has a strong background in measurement technology and is leading the development of novel characterization tools and techniques. He is the co-author or author of over 100 articles in journals and conference proceedings (h-index 24). Dr. Waltl is the director of the Christian Doppler Laboratory for single defect spectroscopy in semiconductor devices and leads the device characterization laboratory at the Institute for Microelectronics at the TU Wien. In addition, he is the principal investigator of several research projects funded by the FFG and has ongoing collaborations with various industrial partners, including ams-OSRAM AG, Infineon, and imec. He is the (co-)recipient of four best paper awards (IIRW2014, DRC2019, IIRW2019, IEDM2019), serves on the technical program and management committee of various international conferences and workshops, and is Associate Editor with the Microelectronics Engineering journal. Based on his expertise, Dr. Waltl is regularly invited as a reviewer of numerous renowned Journals, including IEEE TED, Microelectronics Reliability, Journal of Applied Physics, and many more. |